SENTERRA with Bruker N8 NEOS

Combined AFM and Raman Solution for Advanced Materials Research

A comprehensive materials research investigation demands a multi-technique approach. Bruker Optics’ SENTERRA Raman spectrometer and Bruker Nano’s N8 NEOS Atomic Force Microscope were combined to allow the morphological, structural and chemical analysis of the same sample area. Calibrated sample positioning allows simple and precise serial measurements, where the resultant Raman spectra are easily correlated with the AFM image.

The N8 NEOS SENTERRA combines the flexibility of Raman spectroscopy with userfriendly AFM control. The N8 NEOS SENTERRA provides all the same alignment-free and intuitive design of the original N8 NEOS AFM. By employing a distinctive fiberoptical interferometric detection system instead of conventional beam deflection techniques highly accurate and reproducible tip deflection values are provided directly in nanometers instead of voltages. Furthermore, even after exchanging the cantilever an alignment of the laser is not required.

Optimal stability of the system is achieved by mounting the SENTERRA on the ultra-rigid N8 NEOS granite base.